• Monolithic integrated circuit test system’s data storage and management

    The abstract introduced that one kind applies in the monolithic integrated circuit continent tries system’s chain memory structure, its characteristic lies in uses the construction of data the memory way, and unifies the effective store management method to carry on the management and the assignment to system’s storage space, thus has realized in the ordinary monolithic integrated circuit test system to the volume test result abstraction data management, is advantageous for the system to carry on the data storage, the data to delete, the data inquiry as well as with the superior machine data transmission and so on each operation, strengthened system’s reliability and may the succession.
    Key word chain type memory structure data storage management monolithic integrated circuit test system

    Introduction
        In the automated test domain, the monolithic integrated circuit test system relies on its mature application system, the simple system structure as well as the fine performance-to-price ratio obtained more and more widespread application. In recent years, appeared unceasingly along with the new test object, as well as the test method’s unceasing development, test system’s function was getting more and more perfect, each kind of application situation also day by day enhanced to test system’s request. Present’s too most test system not only need complete the industry scene the real-time observation duty, meanwhile must further realize to the test data real-time processing and the preservation. In the common monolithic integrated circuit test system, the information reserves was not formerly big, the system only need use the few resources to be able to realize the data memory. But along with the memory chip technology’s unceasing development, was suitable for the monolithic integrated circuit system’s memory chip already might preserve over a hundred KB even several MB in the power failure protection situation the data; Similarly, present monolithic integrated circuit test system also faces frequently deals with and preserves over a thousand and even nearly ten thousand test data issue. This to general lacked the operating system support the monolithic integrated circuit test system, was a quite complex work, therefore the present test system often only could aim at the concrete value object to carry on processing, adopted the simple smooth memory way to the mass collection data. Obviously, this method lacks the flexibility, does not favor the monolithic integrated circuit test system processing volume test data, has limited the test system in this aspect development.
        This article mainly aims at a processing test data quantity big kind of test system, the discussion test data memory and the management question. This kind of test system often by the antijamming ability strong monolithic integrated circuit and large capacity, the power failure protection’s memory chip is composed, simultaneously has the high accuracy digital sensor; The construction cost small advantage, the stable property, suits the work in the industry scene, preserved and the processing volume test data, some even can complete the more complex test assignment with the superior machine composition observation network. This article will introduce that one kind applies in the monolithic integrated circuit test system’s chain memory way, can while the industry scene carries on the real-time observation, realizes to the volume test data preservation and the management, has made the good progress in the practical application.

    in 1 large capacity monolithic integrated circuit test system’s memory structure
        In the majority automated test systems, test data’s logical organization can follow the linear logical relation generally, namely data element rope when asks or in the spatial order only divides the priority order, but does not have the high and low level. Therefore when design memory structure often uses the smooth memory structure, its merit lies when the processing linear construction of data the speed is quick, moreover the structure is simple.
        But above situation, in the preamble states in the large capacity test system is not suitable generally. Although the large capacity test system is the linear logical organization similarly, but its test data change is diverse, constitutes the data element internal structure to be also complex, moreover the system must carry out the data storage and the data inquiry and so on many instruction operations, if the application order memory structure will face many questions again.
        First, the test system will face some more special test object frequently. Its test information is more complex, and the data length is not fixed, obviously does not favor uses the smooth memory structure. The supposition system carries on the order according to the time or the spatial logic sequence to save, will then become the difficult problem to storage space’s assignment. If the assignment space is oversized, then influence storage efficiency; Otherwise, also will present the data overflow the situation. , The supposition system can arrange similarly the data the depositing space, when carries on operations and so on data inquiry, data deletion the system will also appear lacks the ability to do what one would like.
        Next, uses the smooth memory structure not to be able to process the abstract data type well. The system when carries on operations and so on data storage, data inquiry as well as data deletion must consider that the data element the length and the content, cannot achieve are flexible, are effective, when the system needs to revise or the promotion, will affect to the data element internal structure’s revision system’s whole operation, thus reduced system’s reliability and highly effective, simultaneously will cause the system to carry on the maintenance and the promotion difficulty increases greatly.
        All questions which in summary, the smooth memory structure cannot solve the large capacity test system when to save and managerial data faces, must therefore consider the non-smooth memory structure in the actual operation the application. For long, little uses such as the chain memory structure in the monolithic integrated circuit system and so on non-smooth memory structure, the reason lies in the chain memory structure to have a set of special store management system to support. In the general-purpose calculator, this function realizes by the operating system or higher order language’s compiling system, but in ordinary monolithic integrated circuit system not mature application case, thus causes the programming the difficulty to be high. Following introduced that one kind applies in the large capacity monolithic integrated circuit system’s store management system, can support the large capacity monolithic integrated circuit test system’s application chain type memory way.

    2 large capacity test system’s store management system
        Regarding uses the chain memory structure the large capacity test system, in the chain table various points physical address is not fixed. In order to avoid when preserves the data possibly appears the storage space conflict question, needs to establish the special store management system to manage the storage space the opening and the release. And, the data guidance table is the store management system’s foundation, is responsible to record in the storage space each data element canned data. Using the data guidance table, simultaneously coordinates to realize operation and so on opening space, release space functions, the test system can realize to the massive storage space effective management.
    2.1 data guidance table
        The establishment data guidance table, is establishes in one kind of chain table between various points and its corresponding physical address relation, standard each point to the storage space use. In the test system, the guidance table only takes section of fixed areas which in the storage space divides, its record object was a section already the continual address space first address which assigned takes and end the address, symbolizes that the preservation assigned the spatial size which in storage space’s some point took, was called one “the record”. Each record in the guidance table’s physical address is continual, and arranges in turn according to each record first address’s size. Data guidance table principle of work like chart l shows.

        When original state, the memory guidance table only then 2 records, indicated that the entire storage space the first address and end the address, this time the entire page space has not saved any test data. Once has the new point to need to preserve in this space, CPU will open a section of continual memory sector for this point for its use, and end the address takes this section of space’s first address a record to read in the memory guidance table. Similarly, when the system needs to delete in a chain table when some page the point, CPU deletes its correspondence’s record in the memory guidance table, releases this segmented address space by this. What is worth explaining, regarding in the guidance table the storage space part which releases, its preservation’s content and throws has the true deletion; Before the recent data covers this address, CPU may through visit this address to read stored datum directly.

    2.2 management storage space function
        Generally speaking, in the general-purpose calculator often using C in language standard storehouse function malloc(), realloc() and free() realizes to the storage space assignment and the management, but this way is inappropriate regarding the general large capacity test system.
        The supposition in the preamble states in the large capacity test system, the system uses 16 bit addresses the monolithic integrated circuit, carries on using the paging storage pattern visit to 512 KB power failure protection memory. Divides into 16 pages the memory (00H~0FH), each page address is 0000H~7FFFFH, total 32 KB. This time the system using malloc() may, in has not been used in the space opens a section of storage space, but this function returns’s address pointer is stochastic, has the possibility the area which is unable in the system to distinguish to ask the space allocation (for example 7FFFH~FFFFH), therefore cannot meet the needs. Moreover, because in the system the memory has the power failure protection function, CPU after on again the electricity will be unable to distinguish has preserved the test data the storage space, thus causes the malloc() function to dwindle. Therefore, as copies the foundation take the data guidance table to establish the storage space the management function. Its concrete function realizes relies on the function to the data guidance table in each record operation, the procedure is as follows:

       
        Take the m_alloc() function as an example, its program flow diagram as shown in Figure 2.

        When the system needs for some point opening storage space. First gives storage space page page which assigns and needs to open spatial length size, then through the m_alloc() function in the corresponding page’s guidance table inquires whether to have the appropriate storage space. Because in the guidance table each record represents a section already the continual address sector which assigns, therefore the m_alloc() function will judge between every two neighboring records from the first start-of-record not to assign spatial the length whether to meet system’s needs. When has a pair of record satisfies the condition, the m_alloc() function will return to this section not to assign the storage space the first address (i.e. the preceding record end address) the indicator. Meanwhile this time opens the spatial compartment in these two record middle insertion the new record. If this page guidance table’s all records do not satisfy the condition, then the m_alloc() function returns returns empty the indicator. the re_alloc() function and the m_free() function complete separately redistribute assign the first address a section of storage space and the deletion assign the first address a section of storage space operation. Its function and the usage and m_alloc() are similar, no longer gives unnecessary detail.

    3 chain memory structure and store management system’s in actual operation application
        The store management system which states using the preceding text may realize in the large capacity test system the application chain type memory structure, does the advantage lies in can simplify the system stored datum effectively the process, is advantageous in carrying out many instruction operations, enhances the system storage space the use factor.
    3.1 SF6 density relay verification system
        As shown in Figure 3, the SF6 density relay verification system by 51 series monolithic integrated circuits, 512 KB power failure protection memory, the printer, the clock system and LCD is composed, has the high accuracy digital pressure transmitter and the temperature sensor, may through 485 main lines and the superior machine correspondences. This system can carry on the verification to the different type density relay, satisfies each kind of nominal parameter and the contact number need, realizes the real time display, the printing data in the verification process and so on many functions; Can preserve many group of verification data to the identical relay, most may preserve more than 4 000 verification data; Regarding all calibration tail, may momentarily carry on the inquiry; Moreover, when carries on the correspondence with the superior machine, has the corresponding superior machine software operations and so on data transmission which, memory space inquiry and data deletion carries on to the lower position machine system.

        Specifically speaking, the SF6 density relay verification system takes the verification object by the SF6 density relay, the verification result contains the SF6 gas the value of pressure and the temperature value, therefore each verification object’s verification result abstract is a data element, includes this verification object separately the test information (for example test date, relay’s test serial number, contact number and nominal parameter information) and group or many group of observed value information (for example verification number of times, warning, block system l, block system 2, overpressure contacts acts separately, time returns value of pressure and temperature value). The system take each data element as the point establishment chain type memory structure, and manages the storage space through the above management memory system the assignment, like this both can guarantee that effective, preserves the verification data reasonably, and can realize operations well and so on data inquiry, data deletion as well as with superior machine correspondence, causes system’s movement to be more highly effective reliably.

    3.2 misalignment logical organization automated test system
        When automated test system faced with misalignment logical organization data element one must adopt the non-smooth memory structure to preserve the data, this time may consider the chain memory structure, or index memory structure as well as binary tree and so on each kind of non-smooth memory structure, but the prerequisite is must have a set of special store management system to support.
        Had above store management system to be used as the basis, each kind of non-smooth memory structure’s application became possibly. When designs the system the full balance storage space’s use factor and the algorithm consume the time, can apply many kinds of memory structures target-oriented and design the corresponding algorithm, satisfies each kind of test object and the testing environment request.

    Conclusion
        Manages the storage space by the chain structure’s form preservation data and through the data guidance table, is applies in the large capacity monolithic integrated circuit test system’s one kind of recent data storage and the mode of administration.
        This memory way is already suitable for the linear logical organization test system, is also suitable for the misalignment logical organization test system, as a whole causes the monolithic integrated circuit system when processes many complex data and carry on preserve, operations repeatedly and so on inquiry and deletion even more quickly easily, enhanced to the limited capacity storage space use factor; At the same time, the structurized data storage caused system’s maintenance and the promotion is more relaxed, has realized system’s structurized management.

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